Technical Education Webinar Series

Title: Enabling 6-44 GHz FR2/FR3 Testing: Anritsu & TMYTEK’s Solution for Semiconductor Module, Chip, and Wafer Testing

Date: September 26, 2024

Time: 8am PT / 11am ET

Sponsored by: Anritsu

Presented by: Wei-Yang Chen (Wayne), TMYTEK Product Manager

Abstract:
In the fast-paced development of 5G/6G and mmWave technologies, precise testing of semiconductor modules, chips, and wafers is essential to ensure reliability and performance. Join our webinar to explore how Anritsu and TMYTEK’s collaborative solution enables testing across a broad RF range from 6 to 44 GHz, covering both FR2 and FR3 bands.

This advanced solution integrates Anritsu’s SG MG3710E Vector Signal Generator and MS2850A Spectrum Analyzer with TMYTEK’s BBox Beamformer and UD Box Frequency Converter, providing precise spectrum measurement and detailed signal analysis. Supporting a wide range of applications, including Wi-Fi 6E/7/8, UWB, SATCOM, 5G NR, and defense radar, this cost-effective solution delivers accurate measurements of directivity, gain, sidelobes, and deflection angles, driving innovation in next-gen wireless communication.

Presenter Bio:
Wei-Yang Chen specializes in mmWave and submillimeter wave front-end RF systems, as well as mmWave circuit (MMIC) design. He earned his M.S. and Ph.D. degrees in Electrical Engineering from National Chung Cheng University in Taiwan. His research interests include MMIC design, microwave/millimeter-wave transceiver module design, microwave/millimeter-wave phased array system design, beamforming network design, and microwave/millimeter-wave circuit/system measurement. Since 2019, he has been with TMYTEK, where he currently serves as the product manager for up/down converter products.

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