Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

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Antenna Measurement Techniques Association (AMTA) Conference

November 19, 2008

Patrick Hindle

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I attended the AMTA Conference this week in Boston at the Park Plaza hotel including the keynote speech by Dr. Eric D. Evans (Director of MIT Lincoln Labs) about radar measurement activities within their organization. I was surprised at the wide array of RF/microwave projects they are working on. He said they are concentrating on key technology enablers such as digital sensors, portable software, open system architectures, sensor/network sidecars and online processors. He said they are still innovating in hardware but spend more effort these days on software. They use rapid proto-typing (3 months from inception to hardware) and typically transfer the technology to industry for production.

There were also a few talks about the European Antenna Network - how they are structured to provide support for antenna research and what projects are underway. A very interesting and comprehensive set of programs for Europe and many of them have global participation.

The exhibits included most of the key players like ETS-Lingren, Agilent, CST, Satimo/Orbit RF, MI, Rohde & Schwarz, etc. One of the most interesting products on display was the helicoidal scanning for elongated antennas from MI Technologies which will greatly speeds up the measurement process (see image).

More to come in my conference wrap up on the Microwave Journal web site.