I always like to find one new product that catches my attention that is from a smaller company that I have not seem before. At EuMW that was Accel-RF. Their new High Power RF (HiPR-AARTS) Automated Accelerated Reliability Test System will help manufacturers prove reliability for application specific GaN devices.

Manufacturers are using Accel-RF’s equipment to prove intrinsic reliability and performance degradation characteristics of GaN technology on discrete devices and lower power MMICs. The next stage in the development of the technology is to build and test high power devices for use in radar and military and communication electronics. The new system is either liquid or air cooled, has RF and DC pulsing capability, and can handle device power dissipation of up to 200 watts each. The system is very compact and can now test devices up to 60 GHz. I was very impressed with its capabilities.