Articles by Mesuro

 Rohde & Schwarz and Mesuro showcase their continuing collaboration on non-linear measurement solutions at European Microwave Week in Rome. In a joint demo at the Rohde & Schwarz booth (hall 9, booth 102), the companies present their testing solution based on the R&S ZVA vector network analyzer from Rohde & Schwarz and Mesuro’s behavioral modeling formulations. 

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.

Mesuro has launched a new test solution that utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments.

Following the completion of a £700,000 funding round to expand its overseas sales and device characterization capabilities, Mesuro has announced the enhanced services and capabilities it is now able to offer its customers

Mesuro, the Cardiff University spin-out that offers testing and services solutions for the semiconductor industry, announced completion of a £700k funding round to expand its overseas sales and device characterisation capabilities.