Articles by S.J.C.H. Theeuwen, J.A.M. de Boet, V.J. Bloem and W.J.A.M. Sneijers, NXP Semiconductors

An overview of the 28-42-50 V LDMOS technologies is given and the ruggedness reliability is discussed, in addition to the RF performance. Various ruggedness tests are presented such as pulsed snapback measurements, VSWR and video bandwidth tests. RF power amplifiers are key components in base stations, broadcast transmitters, ISM...