Articles by staff

AWR Presents at DesignCon 2011

AWR® Corporation's John Dunn and Vladimir Veremey, AWR senior engineers, will present a paper titled "Estimating Q of Spiral Inductors Using EM Simulator" on Tuesday, February 1, 2011 beginning at 2:50pm during DesignCon 2011 in Santa Clara, CA.

January 28, 2011

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Participants will learn how increase efficiency and accuracy of complex, high-frequency and high-speed circuits and to improve time-to-market by using innovative RF/Microwave design software, such as AWR’s SI / Microwave Office® design environment. In addition, AWR will exhibit at DesignCon in booth #423, showcasing its Microwave Office® high-frequency design...

Agilent announces test set for PCI Express® 3.0 receiver characterization.

January 28, 2011

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The PCI-SIG® recently released Revision 3.0 of the PCIe base specification. Many changes in the physical-layer specification are related to ensuring proper bit transmission at 8 GT/s over inexpensive PC boards. Receiver tests are normative now; in previous versions of the standard, these tests were merely informative. Devices operating...

Agilent Highlights Arbitrary Noise Generator Family at DesignCon 2011

Agilent Technologies Inc. (NYSE: A) expanded its pulse function arbitrary noise generator family to help R&D and test engineers test higher speed, higher bandwidth analog, digital and mixed-signal devices more efficiently and with greater precision.

January 28, 2011

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Design and test engineers are under pressure to get products to market faster, with shorter design schedules and yet higher quality goals. In addition, they must differentiate their products in the marketplace by offering unique capabilities, which necessitates expanded test functionality during development. The Agilent 81160A pulse function arbitrary...

Tech Focus

January 11, 2011

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Tech Focus

TestBench
Tektronix Inc. introduced a family of compact RF and microwave power sensors/meters that feature the industry's fastest measurement speed, cover a wide frequency range, and provide extensive power measurements from basic average power to pulse profiling.

EDAFocus
AR RF/Microwave Instrumentation has released the latest version (version 2.0) of its comprehensive EMC test software. The SW1007 software program now includes MIL STD emissions capabilities, along with the radiated susceptibility and conducted immunity capabilities that made the software so popular in the past.

MMICS & More
Hittite Microwave Corp. has introduced a new tunable MMIC bandpass filter, which is ideal for hybrid and microwave integrated circuit applications in wideband test and measurement equipment, communication systems and electronic warfare subsystems to 38 GHz.

November 2010 Web Exclusives

November 13, 2010

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Accelerate your LTE Signal Burst Power Measurements
White Paper Series, Agilent Technologies

Design of Microstrip Planar Triplexer for multi-mode/multi-band Wireless Systems
Chen Zhu, Jianyi Zhou, Yanwei Wang

Tag Designs and Techniques Used in HF RFID Item Level Tracking
Ronald A. Marino

Managing Phase Noise in Microwave Chains
Marjan Grman

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October 2010 Web Exclusives

October 14, 2010

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EMC Pre-compliance Testing: Making Conducted and Radiated Emissions Measurements
White Paper Series, Agilent Technologies

Application Guide to RF Coaxial Connectors and Cables
Michael J. Hannon and Pat Malloy, AR Worldwide

Analysis and Design of the Rectangular Microstrip Patch Antennas for TM_0n0 Operating Mode
Pasquale Dottorato, Consultant

Problem of Physical Non-realizable Equivalent Current Amplitude Distributions in Waveguide Antenna Feeding Slots
Michal Grabowski, PhD Student, Warsaw University of Technology

Simulation of Multipath Fading Effects in Mobile Radio Systems
Firas Mohammed Ali Al-Raie, Polytechnic Higher Institute of Yefren, Libya

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news this week Sept 2010 promo

September 24, 2010

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In our September cover story, the executives responsible for mobile device products at RFMD, Skyworks and TriQuint talk to Microwave Journal about market dynamics and how they are influencing their companies’ business and engineering decisions.