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Two of the most challenging problems in noise behavior are considered: impulse noise and coexisting signals within noise. Modern examples of how a new technique for examining noise can give you the necessary insight to avoid potential design or performance problems will be given.
Darren McCarthy, Tektronix Signals in your noise can really mess up a design. They can impact communication performance or even cause you to fail EMC tests. Understanding what’s in the noise is becoming a more important part of designing products and wireless systems ... New Reply posted 7/31
Win:The first five contributors are eligible to receive a complimentary copy of the textbook: Electrical Engineering – A Pocket Reference from Artech House.
With the cost of developing each new semiconductor manufacturing process node escalating dramatically and time to market pressures increasing, there is no longer room for error in measuring critical parameters such as flicker noise. Recognizing these market realities and their impact on semiconductor manufacturers, Cascade Microtech has introduced the...
AWR® and United Monolithic Semiconductors (UMS) today introduced an advanced process design kit (PDK) for the UMS PPH25X GaAs pseudomorphic high electron mobility transistor (pHEMT) foundry process.
With NMDG extension kits for vector network analysers the user can characterise the nonlinear behaviour of HF components in time and frequency domain under realistic conditions, even in a non-50 Ohm environment. The NMDG NM300 extension kit supports the ZVA and ZVT Network Analysers from Rohde & Schwarz. This...
Agilent Technologies Inc. announced new N5161A and N5162A MXG ATE analog and vector RF signal generators for the cost-sensitive automated test equipment (ATE) environment. In addition to these new models, Agilent announced a series of enhancements to the MXG RF signal generators designed to deliver up to +23 dBm...