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Richardson RFPD, Inc. announced the availability and full design support capabilities for a new 30 to 520 MHz tunable bandpass filter and associated evaluation board from NewEdge Signal Solutions, Inc.
Integrated Device Technology, Inc. (IDT) introduced two high performance SPDT reflective switches, covering 5 MHz to 10 GHz, in compact 2 x 2 mm packages.
Laser Services is announcing the acquisition of a laser marking system that enables Laser Services to provide higher quality marking on a wider range of materials/surfaces, all facilitating a faster turn-around on marking requirements.
Analog Devices, Inc. (ADI) announced the ADF5356, a 13.6 GHz next-generation wideband synthesizer with integrated voltage-controlled oscillator (VCO) which targets applications such as wireless infrastructure, microwave point-to-point links, electronic test and measurement and satellite terminals.
NEO Tech announces that it will showcase its high-reliability substrate and microelectronic assembly capabilities in booth 1357 at the 2017 International Microwave Symposium (IMS).
Infinite Electronics, Inc., a holding company for the Pasternack, Fairview Microwave and L-com brands, announced the acquisition of Smiths Interconnect’s Microwave Telecoms (SMT) business from Smiths Group plc. SMT comprises of the Kaelus, PolyPhaser, Transtector Systems and RadioWaves brands.
Integrated Device Technology, Inc. (IDT) introduced the IDT® F2480 analog variable gain amplifier (AVGA), the first in a family of high performance devices for a broad set of communications equipment.
Raytheon Company and the U.S. Navy conducted the Preliminary Design Review for the new Enterprise Air Surveillance Radar, confirming system development is on track for delivery to the designated ship classes.
Keysight Technologies, Inc. announced the Keysight Test Platform 195 is the first and only test platform that includes RF NB-IoT and CAT-M validated test cases together in the Global Certification Forum (GCF).
Microwave engineers at RCL Microwave, Inc. in Apalachin, NY have executed their first successful test and dielectric measurement of a thin, flexible 200 micron thick glass material using novel measurement fixtures and methods capable of broadband dielectric material characterization.
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