RF & Microwave Industry News

Dr. Song Junde to give keynote speech at EDI CON 2014 as conference chairman emeritus

EDI CON 2014 has announced that Dr. Song Junde, professor at the Beijing University of Posts and Telecommunications, will serve as the chairman emeritus of the second annual technical conference and trade exposition focused on RF, microwave and high-speed digital design. Junde, who held the role of honorary chair for the inaugural EDI CON in March of 2013, will once again provide guidance to the event organizers and technical program planning committee in the development of a technical conference focused on advancing microwave technology and the communications industry in China. 


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Frequency Matters, Jan 27, 2014

RF/microwave Industry Update

Frequency Matters 5Watch episode 5 (Jan 27, 2014) of the bi-weekly industry update video series, Frequency Matters. Editors David Vye and Pat Hindle host the show covering RF/microwave news, events and technical content. Catch up on the latest happenings in the industry.


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API introduces radiation tolerant VCSOs

API Technologies Corp. a leading provider of high performance RF/microwave, power, and security solutions for critical and high-reliability applications, now offers a new line of radiation tolerant voltage controlled surface acoustic wave (SAW) oscillators (VCSO) for space, satellite communications, and aerospace systems. API Technologies is the first manufacturer of radiation tolerant VCSOs utilizing a MIL-PRF-38534 Class K certified facility.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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