RF & Microwave Industry News

A Temperature-compensated Closed Loop Overdrive Level Controller for Microwave Solid-state Power Amplifiers

The reliability of GaAs power FETs used in solid-state power amplifiers (SSPA) is adversely affected when operated in an overdrive (excess input power) condition for a long time due to excess gate current. Manufacturers of SSPAs use different schemes to protect the FET power devices from overdrive conditions. One...
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Multipin Headers with Integrated Filtering

Thunderline MultiPins™ address the many space and time saving issues facing today’s high frequency designers. In addition to being more compact than individual feedthrus, the use of MultiPins saves installation time and automatically maintains critical pitch and spacing dimensions. They are available in a variety of styles from 2...
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65 GHz VNA Test Port Extension Cables

Most VNA measurements require the use of extension cables as part of the test set-up. Measurement accuracy can be severely degraded if these cables are not stable over time and flexure. Thus, the choice of measurement cables is as important as the instrument itself. The MegaPhase® VN series are...
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Automation and Real-time Verification of Passive Component S-parameter Measurements Using Loss Factor Calculations

An automated S-parameter testing approach, built around a LabVIEW program, is described that adds important capabilities to a microwave test setup. A real-time check on S-parameter data using total loss calculations is shown to be a good indicator of m...
In developing microwave models, real-time verification of characterization data should be considered a priority to ensure its integrity. Sound models must be built upon accurate measurement data, and, as is generally the case, the ‘garbage in – garbage out’ principle applies to model extraction. Even if an instrument calibration...
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Noise Can Be Good, Too

In communications, noise is an annoying phenomenon. Noise occurs naturally and is random, contrary to human-engineered intelligence. Engineers define the signal-to-noise ratio as the most important quantity that qualifies any information-transmitting system fit or unfit for use. Researchers utilize sensitive radio and microwave receivers (sometimes also transmitters) to obtain...
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Increasing RF Device Test Throughput with Better Instrument Coordination

Knowledgeable use of the programmability of today’s multi-function instruments can go a long way toward reducing test costs and improving manufacturing productivity.
Testing speed is important for all electronic components, but it is vital for low price two- and three-terminal devices such as diodes and transistors. Before RF tests can be conducted, the devices must be tested for DC operation. For diodes, that includes forward voltage, reverse breakdown voltage and leakage...
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