The importance of taking due care in setting up IV measurement sweep rate is explored for the case of a GaAs MESFET and a silicon MOSFET. A numerical metric, called the normalized difference unit (NDU), is shown to be useful in determining appropriate ...
The DC IV characterization of a device is important in predicting RF operation. DC IV results predict the quiescent bias and low frequency IV characteristics for a device, while in some cases they can be corrected to represent RF characteristics at a given quiescent bias point. 1,2 In addition,...
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