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Hardware abstraction layers (HALs) and measurement abstraction layers (MALs) are some of the most effective design patterns to make test software as adaptable as the hardware. Rather than employing device-specific code modules in a test sequence, abstraction layers give you the ability to decouple measurement types and instrument-specific drivers from the test sequence. Learn how to drastically reduce development time by giving hardware and software engineers the ability to work in parallel.
Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps
produce communications equipment with the lowest levels of passive intermodulation (PIM).
This paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.
RF laterally diffused MOS (LDMOS) is currently the dominant device technology used in high-power RF power amplifier (PA) applications for frequencies ranging from 1 MHz to greater than 3.5 GHz. This paper will include device and design considerations that specifically target enhancing ruggedness performance. The features of the products using this platform will also be presented.
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Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps
produce communications equipment with the lowest levels of passive intermodulation (PIM).
This paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.
