Articles Tagged with ''s-parameter''

OML introduces millimeter wave intermodulation distortion (IMD) measurements to target emerging gigabit applications such as WirelessHD, WiGig, 802.11ad and E-band point-to-point radios. In these applications, the linearity of amplifiers and transceivers can adversely affect bit terror rate, especially those involving higher order modulation.

Aeroflex/Inmet Inc. and Modelithics Inc. have teamed to develop Global™ Models for Aeroflex/ Inmet surface mount attenuators (PCAF and PCAAF series) and high power chip resistors (NPC50-50W and NPC50-100W series). The advanced model features include  substrate scaling, pad geometry scaling and part value selectability.

OML announces a direct connect configuration that supports millimeter wave S-parameter measurements using the ZVA series network analyzer from Rohde & Schwarz. This entry-level configuration offers engineers the versatility to connect VxxVNA2 series modules directly to the front panel of a four-port dual-source vector network analyzer.

Jon Martens of Anritsu and Al Neves of Wild River Technology used DesignCon 2012 to discuss high-confidence S-parameter measurement methodologies for 15 - 28 Gbpsec.