R&S®FSWP Phase Noise Analyzer and VCO Tester at IMS2019

Rohde & Schwarz will be demonstrating the latest bench and field solutions for signal generation and analysis in the RF, microwave and mmWave range in Booth 642 at IMS2019, featuring high sensitivity, pulse and additive phase noise measurements using the R&S®FSWP Phase Noise Analyzer and VCO Tester.

R&S®FSWP Phase Noise Analyzer and VCO Tester supports phase noise analysis up to 50 GHz in a single platform. It combines extremely low noise internal sources and cross correlation technology, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, additive phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.

Key facts

• Frequency range from 1 MHz to 8/26.5/50 GHz
• High sensitivity for phase noise measurements thanks to cross‑correlation and extremely low‑noise internal reference sources
  • typ. –172 dBc (1 Hz) at 1 GHz carrier frequency and 10 kHz offset
  • typ. –158 dBc (1 Hz) at 10 GHz carrier frequency and 10 kHz offset
• Simultaneous measurement of amplitude noise and phase noise
• Measurement of phase noise on pulsed sources at the push of a button
• Internal source for measuring additive phase noise, including on pulsed signals
• Signal and spectrum analyzer and phase noise analyzer in a single box
  • High‑end signal and spectrum analyzer, 10 Hz to 8/26.5/50 GHz
  • Wide dynamic range thanks to low displayed average noise level (DANL) of –156 dBm (1 Hz) (without noise cancellation) and high TOI of typ. 25 dBm
  • 320  MHz signal analysis bandwidth
  • Total measurement uncertainty: < 0.2 dB up to 3.6 GHz,< 0.3 dB up to 8 GHz
  • Touchscreen operation
  • Large 12.1 in. display for simultaneous viewing of multiple measurement windows
  • Various measurement applications can be run and displayed in parallel
• High measurement speed
• Low‑noise internal DC sources for VCO characterization
• Automatic VCO characterization
• Analysis of up to 8 GHz wide frequency hops (transients)
• Measurement of Allan variance