National Instruments introduced test solutions for 802.11ac WLAN and Bluetooth low-energy technology that combine NI graphical system design software and modular, FPGA-based PXI instrumentation to provide high-performance test capabilities that are completely user-programmable. These test solutions along with other cellular, navigation and wireless connectivity solutions from NI, help engineers thoroughly test their devices on a single high-performance platform.

“Using the software-designed vector signal transceiver and the WLAN measurement suite, we improved our test speeds by more than 200 times compared to traditional rack-and-stack instruments while also significantly improving test coverage,” said Doug Johnson, director of engineering at Qualcomm Atheros.

Product Features

  • Ideal for characterization and production test with best-in-class RMS EVM of -46 dB for 256 QAM
  • Ability to perform measurements and custom algorithms in the onboard FPGA of the NI PXIe-5644R VST for faster measurements and real-time test

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