Cleveland, Ohio - March 31, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has been named a finalist in EDN Magazine's 18th Annual Innovation Awards Competition in the General Purpose Test and Measurement category for its 4X4 MIMO (multiple-input, multiple-output) RF Test System. EDN's Innovation Awards Competition recognizes and honors the people, products, and technologies that have shaped the semiconductor industry over the past year. The finalists are selected by engineers and engineering managers around the world by voting online at www.edn.com/innovation18 for the best product in each of 21 categories. Winners will be announced at a dinner and awards ceremony on April 14, 2008 in San Jose, CA.
Keithley's 4X4 MIMO RF test system is designed for R&D and production testing of next-generation RF communications equipment and devices. Superior technical specifications allow engineers to take high-performance measurements on demanding signals for next-generation mobile communication devices, including the kind of systems envisioned for city-wide wireless access. The 4X4 MIMO RF test system consists of the new Model 2920 RF Vector Signal Generator (VSG), Model 2820 RF Vector Signal Analyzer (VSA), Model 2895 MIMO Synchronization Unit, and powerful MIMO Signal Analysis Software. No other 4X4 MIMO test system in the industry combines the high-performance specifications demanded by engineers with the versatility of support for a multitude of commercial wireless standards including cellular, WiMAX, WLAN, CDMA, GSM, and others.
Keithley's 4X4 MIMO RF test systems are ideal for research and development engineers and scientists at WLAN and WiMAX design centers and research and development centers. In addition, test engineers involved with 3GPP cell phone production and RF power amplifier manufacturing, as well as W-CDMA base stations and other wireless connectivity solutions in defense and aerospace applications, can also take advantage of the speed, accuracy, and flexibility that these powerful test systems offer.
Keithley's next-generation RF test instruments are designed to meet the challenges faced by designers and manufacturers of today's wireless technologies and are suitable for future technologies. Keithley's RF test instruments are built on a next-generation instrument platform that uses state-of-the-art RF and high-speed DSP technology to reduce the cost of test and shorten time to market. They provide the measurement accuracy needed to ensure high product quality and production yields and high test speed and low equipment cost needed to reduce the cost of test.
