Head to Head: NI PXIe-5665 Versus Traditional Boxed Instruments
White Paper, National Instruments
Free Poster: Electronics/EMC Equations & Conversion Charts
AR Microwave Instrumentation
Rugged LDMOS Transistors for ISM and Broadcast
David Lester (Freescale Semiconductor) and Tim Vaughan (Richardson RFPD)
Microwave Applicator with Conveyor Belt System
Presented by COMSOL
RFID objects monitoring in space bounded by metallic walls.
S. Korneev, S. Alyakrinsky; Scientific & Technical Center Alpha-1 LLC