Special IMS 2011 MicroApps Presentation
A 90 minute forum and webcast, featuring experts in RF nonlinear device measurement and characterization.
Location: IMS Exhibition MicroApps. Baltimore, Maryland
Time: June 8, 12:00 – 1:30 pm
Our panel of experts will discuss solutions and trends in nonlinear device characterization from the perspective of new measurement equipment, techniques and device representation in EDA tools. An open panel discussion session will follow the presentations including audience questions from both live and online participants.
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Industry Trends and Solutions in Nonlinear Component Characterization - Agilent Technologies
Vector Network Analysers and Non-50 Ohm Characterization - NMDG/Rohde & Schwarz
The Need for Integrated PA Design Chain - Mesuro/Tektronix
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SPEAKERS:
Loren Betts
Research Scientist/Senior Engineer, Agilent Technologies
Loren Betts received his BSc degree in computer engineering from the University of Alberta, Edmonton, Alberta, Canada, in 1997, and his MSc degree in electrical engineering from Stanford University, Stanford, CA, in 2003. In 2010 he completed his PhD degree in electrical engineering from the University of Leeds, Leeds, UK. His PhD research focused on the Nonlinear Vector Network Analyzer (NVNA) based on the Agilent PNA-X. He led a team that won the “Barnholt Innovation Award” for the NVNA as the invention of the year at Agilent Technologies in 2008. He was also awarded the “Bill Hewlett Award” in 2010 for a patented technology used in pulse detection algorithms.
He is currently a research scientist and senior engineer at Agilent Technologies focusing on complex stimulus/response measurements and modeling of nonlinear components utilizing vector network analyzers. He co-developed the pulse measurement detection algorithms utilized in current Agilent PNA and PNA-X VNAs.
Steve Reyes
Product Marketing Manager Network Analyzers, Anritsu
Steve Reyes has designed and marketed microwave test equipment for more than 25 years and was a member of the product team for the Model 360 VNA and VectorStar. He has presented numerous papers and conducted workshops on microwave test and measurement for ARFTG, NIST, and IEEE. Steve is the Product Marketing Manager for Vector Network Analyzers at the Microwave Measurement Division of Anritsu Company
Marc Vanden Bossche - Sponsored by Rohde & Schwarz
Founder and CEO, NMDG Engineering
Marc Vanden Bossche received the degree of electrotechnical - mechanical engineer from the Vrije Universiteit Brussel (VUB), Brussels, Belgium in 1984 and the Ph.D. degree from the same university in electrical engineering in 1990. From 1985 to 1987, he was a Research Assistant of the National Fund for Scientific Research, Belgium, before joining the Hewlett Packard Company in 1987 to work on the foundation of large-signal network analysis during his PhD. In 1991 he established and was leading a Hewlett Packard R&D team in Belgium focusing on characterization and modeling tools for high frequency electrical components. The research and development of large - signal network analysis tools for RF, microwave and high speed digital components continued within Agilent Technologies. In June 2003 Marc founded NMDG Engineering bvba to commercialize and evolve this technology. Attracting additional funds in 2006 and 2007, NMDG Engineering was being launched in a next phase of commercialization as NMDG NV. Presently, Marc Vanden Bossche is CEO of NMDG, is IEEE member and chair of TC33 of the IEEE Instrumentation and Measurement society.
Johannes Benedikt - Sponosred by Tektronix
CTO, Mesuro
Johannes Benedikt is CTO at Mesuro Ltd, leading the commercial introduction of new measurement solutions that enable systematic waveform engineering at RF and microwave frequencies. He took up the position, which evolved from his work at Cardiff University, UK, in October 2008. He received a Degree in Electrical Engineering from the University of Ulm, Germany in 1997. While studying for a PhD Degree at Cardiff University, which he received in 2002, he held an additional position as a senior research associate supervising a research programme with Nokia on RF power amplifiers. He was appointed as a Lecturer in 2004, a Senior Lecturer in May 2009, and a Professor in May 2010 at Cardiff University with responsibility for expanding research on large-signal measurement systems and their application in RF PA design. He has been involved in the development of a number of time-domain characterisation and active harmonic load pull systems.
Moderated by Dr. Joseph M. Gering
Senior Manager of III-V Technology Design Enablement, RFMD
Joseph Gering has a BS from the University of Louisville and an MS and a Ph.D. from the University of Illinois at Urbana-Champaign. His group covers modeling (physics-based, large-signal equivalent-circuit, and behavioral), CAD tools (including design kits), mask layout, and the device metrology lab, all of which support RFMD’s internal semiconductor and laminate processes. His technical interests include modeling and characterization of III-V devices and related measurement techniques with an emphasis on large-signal characterization. Prior to joining RFMD, he was with Skyworks Solutions in the modeling group and before that Raytheon Company in several device development roles. He has over 25 years of experience with III-V device development, modeling, and characterization and has worked with 94 GHz IMPATT diodes and 900 MHz HBTs. Joe is on the technical program committee of the Compound Semiconductor IC Symposium (CSICS) and was recently elected to the executive committee of the Automatic RF Techniques Group (ARFTG). He has authored or been a co-author on papers dealing with large-signal measurement techniques, device modeling and characterization, and even RF front-end modules.
Sponsored by
Agilent Technologies
Anritsu
Rohde & Schwarz
Tektronix