David K. Walker, Dylan F. Williams, Allen Padilla, Uwe Arz, Hartmut Grabinski

Articles by David K. Walker, Dylan F. Williams, Allen Padilla, Uwe Arz, Hartmut Grabinski

A Four-port Microwave Measurement System to Speed On-wafer Calibration and Test

Description of a new multiport calibration technique utilizing a four-port wafer-probe system

March 1, 2001

David K. Walker, Dylan F. Williams, Allen Padilla, Uwe Arz, Hartmut Grabinski

TECHNICAL FEATURE A Four-port Microwave Measurement System to Speed On-wafer Calibration and Test A four-port measurement system comprising an inexpensive coaxial switch matrix and a comprehensive free software package extends the capabilities of a user's two-port automatic network analyzer and probe station to three- and four-port measurements. The software...