Articles Tagged with ''test''

AWT Global introduces low PIM anechoic antenna test chambers: ATC Series

AWT Global’s new ATC series low PIM anechoic chambers are designed for measuring antennas from 700 to 6000 MHz. Besides the high shielding coefficient of more than 90 dB, ATC series antenna test chambers generate lowest residual passive intermodulation (PIM). The combination of chamber geometry, specifically designed pyramidal electromagnetic absorbing material and innovative manufacturing techniques result in remarkable characteristics.


Read More

Nujira selects LTX-Credence production testers

Nujira Ltd., the world’s leader in Envelope Tracking (ET) technology, has signed a partnership agreement with LTX-Credence Corp., a global provider of market focused, cost-optimized semiconductor test solutions. The agreement will see Nujira use the LTX-Credence Diamond10 tester for testing of its Coolteq.L High Accuracy Tracking ET modulator ICs ahead of full volume production later this year.


Read More