Articles Tagged with ''test''

SGS has selected Anite’s Propsim channel emulators for its new anechoic MIMO Over-The-Air test laboratory in Taiwan.

The all new, patent pending, design of Loop Test Translators (LTT) from AtlanTecRF are the most comprehensive yet in featuring a reversible signal path and the unique capability of differing and independent transfer characteristics in forward and reverse directions. 

 Agilent Technologies Inc. announced that its SystemVue 2013.08 Service Pack 1 supports co-simulation with the Questa functional verification platform from Mentor Graphics. System architects and FPGA designers are now able to cross-validate RF and DSP architectures directly, saving research and development time, as well as design iterations in high-performance applications, such as radar and communications. 

 Agilent Technologies Inc. announced a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification. 

At the international Automotive Testing Expo 2014 in Stuttgart Rohde & Schwarz will exhibit its test solutions for wireless applications such as vehicular radar, intelligent transport systems, eCall and automotive Ethernet interfaces.

The IDA 2 Interference and Direction Analyzer from Narda Safety Test Solutions now generates persistence spectrums, which means that interference hidden beneath strong signals can now be detected and traced on the spot.

Agilent Technologies Inc., announces the Agilent HDMI 2.0 6G test solution has been selected by Simplay Labs after the HDMI Forum certified it as an official compliance test tool.

The RF Test Blog is a resource for finding ways to make better RF measurements. With over 10,000 visits since 2013, this popular blog includes information on equipment and measurement techniques that improve accuracy, measurement speed, dynamic range, sensitivity, repeatability, and more. 

Agilent Technologies Inc. announced it will attend IMS 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Agilent Technologies Inc. announced the availability of a powerful new automatic fixture removal (AFR) option for its PNA Series network analyzers. Previously available only in Agilent’s Physical Layer Test System (PLTS) software, the error-correction technique is the industry's fastest, easiest way to accurately measure non-coaxial devices, saving engineers time and money.