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Company Profile
Committed to Engineers and Scientists
Since 1976, National Instruments has equipped engineers and scientists with tools that accelerate productivity, innovation, and discovery. NI's graphical system design approach provides an integrated software and hardware platform that simplifies development of any system that needs measurement and control. Engineers and scientists use this platform from design to production in multiple industries, advanced research, and academia. The company's long-term vision and focus on improving society through its technology has led to strong, consistent company growth and success of its customers, employees, suppliers, and shareholders.
Since 1976, National Instruments has equipped engineers and scientists with tools that accelerate productivity, innovation, and discovery. NI's graphical system design approach provides an integrated software and hardware platform that simplifies development of any system that needs measurement and control. Engineers and scientists use this platform from design to production in multiple industries, advanced research, and academia. The company's long-term vision and focus on improving society through its technology has led to strong, consistent company growth and success of its customers, employees, suppliers, and shareholders.
Contact Information:
Phone: (800) 433-3488
Email: Click here to see email.
Website: https://www.NI.com
Location:
National Instruments
11500 N Mopac Expwy.
Austin TX 78759
United States
November 18, 2020
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Electro Rent and NI Announce Global Rental Collaboration
June 2, 2020
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National Instruments to Acquire OptimalPlus
December 5, 2019
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NI Launches 4 GHz Vehicle Radar Test System
November 15, 2019
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NI, ETAS to Advance Hardware-in-the-Loop Validation
November 1, 2019
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NI Announces Plan for CEO Transition
September 30, 2019
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NI Announces Sub THz Testbed for 6G Research
November 28, 2018
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NI Announces New Features and Functionality for LabVIEW NXG
June 22, 2018
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NI Showcases 5G Test with Skyworks
June 13, 2018
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National Instruments Adopts AccelerComm’s 5G NR Polar IP
February 28, 2018
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Qorvo® and NI Demonstrate First 5G RF Front-End Module
October 6, 2017
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NI Trend Watch 2018 Explores the Trends Driving the Future Faster
September 28, 2017
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NI AWR Software Featured in Booth Demos, MicroApps, Workshops at EuMW
May 10, 2017
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NI AWR Design Environment V13 Highlighted at IMS2017
May 4, 2017
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NI AWR Design Environment Featured at NIWeek 2017
The quest for highly efficient 5G wireless connectivity has been given a boost thanks to a collaboration between a team of 5G engineers from the Universities of Bristol and Lund, National Instruments (NI), and BT Labs, one of the world’s leading providers of communications services. The research team has undertaken field trials of a massive MIMO system at the BT Labs in Adastral Park, Suffolk. The trials were conducted in a large indoor hall mimicking a stadium environment and outdoors within the Adastral Park campus.
NI announced the availability of the USRP-2945 quad receiver software defined radio (SDR) and the USRP-2944 high performance 2x2 multiple input, multiple output (MIMO) SDR. Both models deliver a new level of performance and capability to the USRP (Universal Software Radio Peripheral) family.
Version 13, the first major update in 2017 to 
NI, the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the opening of the new NI Industrial IoT Lab at its Austin,Texas headquarters.
In this special edition of the Automated Test Outlook 2017, NI co-founder and chairman of the board Dr. James Truchard reflects on the past 40 years of test and measurement, identifies the most significant market and technology trends from recent years and looks forward to what lies ahead.
NI and Astronics Test Systems Inc., (ATS) a wholly-owned subsidiary of Astronics Corp. announced the Astronics PXIe-6943 Digital Test Instrument, Astronics PXIe-3352 Rubidium Clock Source and Astronics PXIe-1209 Pulse Pattern Generator. The three new test instruments accompany the previously released Astronics PXIe-2461 Frequency Time Interval Counter and are the latest products from NI and Astronics’ collaboration to provide PXI-based instruments with test program set-(TPS-) compatible software for existing VXI instruments.
NI announced LabVIEW Communications System Design Suite 2.0, a development environment specifically designed for prototyping wireless communications systems. This new version adds NI Linux Real-Time capability for all software defined radio (SDR) products including the NI USRP RIO and FlexRIO.
NI announced a second-generation vector signal transceiver (VST).The NI PXIe-5840 module is the world’s first 1 GHz bandwidth VST and is designed to solve the most challenging RF design and test applications.
NI announced the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs.
NI, a provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI PXIe-4081 7½-digit high-performance DMM and 1.8 MS/s isolated digitizer. The NI PXIe-4081 is the first PXI Express DMM available. It offers engineers the flexibility, resolution and isolation needed to tackle challenging applications that require smarter test systems in industries ranging from consumer electronics to aerospace and defense.April 25, 2016
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NI AWR Software showcased in slate of activities at IMS2016
NI, the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announcedtoday the world’s first software defined radio (SDR) for the millimeter wave (mmWave) spectrum. The new NI mmWave Transceiver System is a full transceiver that can transmit and/or receive wide-bandwidth signals at an unprecedented 2 GHz real-time bandwidth, covering the spectrum in the E-band, 71 to 76 GHz.
NI announced the release of its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.September 18, 2015
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NI AWR Software presentation accepted at Power Amplifier Symposium
NI (formerly AWR Corp.) released its version 12 Analyst-MP™ 3D multiphysics finite element method (FEM) electromagnetic (EM) analysis software. This latest version delivers up to 10X improvement in speed from the previous version, making it even faster for analyzing extremely complex high-frequency, multiphysics structures.
NI, the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the opening of the new Wireless Innovation Lab at its Austin, Texas headquarters.
NI (formerly AWR Corp.) will be showcasing NI AWR Design Environment™ software at Booth #315 at the Electronic Design Innovation Conference 2015 (EDI CON), being held April 14-16 in Beijing, China.
Cobham Wireless, formerly the Wireless Test Business of Aeroflex, and NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a worldwide partnership to service applications in cellular and connectivity with solutions based on PXI technology.September 10, 2014
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NI AWR to feature software demos, MicroApps, PA Forum & more at EuMW
National Instruments announced 10 pieces of new application IP that enable engineers and scientists to use NI LabVIEW system design software to build their own custom RF instruments. This IP integrates with PXI FPGA targets such as the NI PXIe-5644R VST and extends their default capabilities.
National Instruments announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. 
National Instruments released its Automated Test Outlook 2013 highlighting the company’s research into the latest test and measurement technologies and methodologies. The report examines trends affecting a variety of industries. October 30, 2012
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MILCOM 2012 Sacked by Sandy
Introduction to the vector signal transceiver that combines a vector signal analyzer, a vector signal generator and a high speed digital I/O
Eric Starkloff, Vice President of Marketing for Test and Embedded at National Instruments, talks about the company's development of new RF/microwave products and its push into the RF design realm via AWR's Microwave Office.
NI and Astronics Test Systems Inc. announced the Astronics PXIe-6943 Digital Test Instrument, Astronics PXIe-3352 Rubidium Clock Source and Astronics PXIe-1209 Pulse Pattern Generator. The three test instruments accompany the previously released Astronics PXIe-2461 Frequency Time Interval Counter and are the latest products from NI and Astronics’ collaboration to provide PXI-based instruments with test program set-(TPS-) compatible software for existing VXI instruments.
NI announced the NI PXIe-4081 7½-digit high-performance DMM and 1.8 MS/s isolated digitizer. The NI PXIe-4081 is the first PXI Express DMM available. It offers engineers the flexibility, resolution and isolation needed to tackle challenging applications that require smarter test systems. The NI PXIe-4081 is the industry’s most accurate 7½-digit DMM, with an industry-leading 15 ppm accuracy for DC V measurements up to two years after calibration.
The NI PXIe-5668R vector signal analyzer (VSA) offers 765 MHz of bandwidth with best-in-class measurement performance and speed. This high-performance microwave signal analyzer meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence.
Gain the flexibility you need to build a measurement system that meets your application-specific requirements. The CompactDAQ controllers integrate a processor and removable SD storage with high-quality signal conditioned measurements and digital, counter, and communication bus I/O in a small, rugged enclosure. You can reduce system cost and complexity while increasing accuracy.
The NI USRP™ RIO software-defined radio (SDR) platform provides the optimum balance between price, performance and form factor. Built on the NI LabVIEW reconfigurable I/O (RIO) architecture, NI USRP RIO delivers an integrated hardware and software solution for rapidly prototyping high-performance and high-channel-count wireless communication systems.
Visual System Simulator™ (VSS) is a complete software suite for today’s complex communication systems that enables engineers to design the right system architecture and formulate suitable specifications for each of the underlying components. VSS is built upon Unified Data Model™ architecture (as is Microwave Office®) and therefore provides for seamless system and circuit level co-simulation.
The NI PXIe-7975R FPGA module features a digital signal processing (DSP)-focused Xilinx Kintex-7 FPGA and 2 GB/s of onboard DDR3 DRAM. This FPGA incorporates 1,540 DSP slices, which you can use to implement digital filters, custom signal processing, and Fast Fourier Transform (FFT) logic, all of which are commonly found on analog FPGA-based instruments.
The NI PXIe-5186 digitizer, co-developed by National Instruments and Tektronix, delivers a new level of performance in the small-form-factor, low-power PXI platform. Tektronix technology provides the trusted measurement fidelity of Tektronix oscilloscopes. The digital back end uses NI synchronization and memory core (SMC) technology to deliver high-data throughput at rates greater than 700 MB/s.Downloads
A Simulation-Based Flow for Broadband GaN Power Amplifier Design
This application note demonstrates a simulation-based methodology for broadband power amplifier (PA) design using load-line, load-pull, and real-frequency synthesis techniques. The design highlighted in this application note is a Class F amplifier created using the Qorvo 30 W gallium nitride (GaN) high electron mobility transistor (HEMT) T2G6003028-FL.
Download
5 RF Transmitter Measurements Every Engineer Should Know
RF transmitters are an essential part of modern communications. Designed and assembled from core RF components, RF transmitters have many different forms and applications. We often think of RF transmitters in wireless communications, but the concept applies equally to wired applications such as cable television.
DownloadLabVIEW FPGA and Software-Designed RF Instrumentation
National Instruments is leading the way in providing more open and flexible measurement devices based on field-programmable gate array (FPGA) technology. Learn how you can use NI LabVIEW FPGA to design and customize your RF instrumentation, and discover the advantages software-designed instrumentation can provide in your test systems.
Read the white paper.
DownloadNI RF & Microwave Reference Poster
Request your free copy of the NI RF and microwave poster, a comprehensive reference chart of the latest wireless standards, conversion tables, and formulas.
Order to receive your full color poster by mail.
DownloadBest-in-Class WLAN Measurements
The modern breed of test engineers is already using intuitive new technologies to reduce space and decrease test and development time all in a reduced budget. National Instruments is helping test engineers address these challenges with user-programmable FPGA-based instrumentation. Learn more about the benefits of using an open field-programmable gate array (FPGA) for 802.11ac testing specifically.
Read the white paper.
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What Is a Vector Signal Transceiver (VST)?
Software-defined RF test system architectures have become increasingly popular over the past several decades. Almost every commercial off-the-shelf (COTS) automated RF test system today uses application software to communicate through a bus interface to the instrument. As RF applications become more complex, engineers are continuously challenged with the dilemma of increasing functionality without increasing test times, and ultimately test cost. While improvements in test measurement algorithms, bus speeds, and CPU speeds have reduced test times, further improvements are necessary to address the continued increase in the complexity of RF test applications.
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Redefining RF and Microwave Instrumentation
National Instruments has redefined the traditional approach by combining PXI hardware and NI LabVIEW system design software, leveraging commercial technologies such as multicore microprocessors, user-programmable FPGAs, PCI Express hardware, and system design software to meet the flexibility and scalability demand for future high-frequency test and measurement applications.
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Head to Head: NI PXIe-5665 Versus Traditional Boxed Instruments
This paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.
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Strategies for Signals Intelligence from Antennas to Analysis
Signals intelligence describes a broad range of applications ranging from communications jamming to identification of interference or pirating signals. While this paper discusses many of the specific needs for each application, it primarily focuses on the techniques required to analyze intermittent or "bursty" RF signals.
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